SUFINAH DAHARI. Modified Levey-Jennings Chart with Robust Estimator: A Case of Semiconductor Manufacturing Process. Journal of Advanced Research in Applied Sciences and Engineering Technology, [S. l.], v. 43, n. 2, p. 189–202, 2024. DOI: 10.37934/araset.43.2.189202. Disponível em: https://semarakilmu.com.my/journals/index.php/applied_sciences_eng_tech/article/view/4387. Acesso em: 22 jul. 2024.