Double Resonance Characteristic of Photonic Crystal Structure with Defect Metal Layer

Authors

  • Teguh Puja Negara Department of Computer Science, Faculty of Mathematic and Natural Science, Universitas Pakuan, Bogor, Indonesia
  • Sudradjat Supian Department of Mathematic, Faculty of Mathematic and Natural Science, Universitas Padjajaran, Bandung, Indonesia
  • Subiyanto Department of Mathematic, Faculty of Mathematic and Natural Science, Universitas Padjajaran, Bandung, Indonesia
  • Mohd Kamarulzaki Mustafa Department of Physics and Chemistry, Faculty of Applied Science and Technology, Universiti Tun Hussein Onn Malaysia, Johor, Malaysia

DOI:

https://doi.org/10.37934/araset.44.2.175183

Keywords:

Transmittance characteristic, photonic crystal structure, resonance of photonic crystal, finite difference frequency domain method

Abstract

The optical response of the photonic crystal structure has been analyzed using the Finite Difference Frequency Domain (FDFD) method. Simulation using this method aims to analyze the characteristics of light transmission when interacting with related structure. The results of the study of photonic crystal structures with two defects show that there are two transmittance bands called double resonances at two specific wavelengths. Changes in the resonance peak with respect to the variations of refractive index in the second defect layer resulted in a linear change with significant sensitivity. For photonic crystals with two defects, the first defect is a metal layer and the second defect is material sensing, which produces double resonance with a sensitivity of 7,825 and 3,2675, while for photonic crystals with the first defect, a dielectric layer, and the second defect is material sensing, produces single resonance with a sensitivity of 2,022. The choice of the first defect is that the metal layer is quite important, in addition to producing greater sensitivity, it also produces a field enhancement between the dielectric and the metal layer which is called surface plasmon resonance (SPR). The sensitivity value can also be set by determining the thickness of the second defect layer. These results can be used as a standard for fabrication and developed for sensor applications.

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Author Biographies

Teguh Puja Negara, Department of Computer Science, Faculty of Mathematic and Natural Science, Universitas Pakuan, Bogor, Indonesia

teguhpuja795@gmail.com

Sudradjat Supian, Department of Mathematic, Faculty of Mathematic and Natural Science, Universitas Padjajaran, Bandung, Indonesia

sudradjat@unpad.ac.id

Subiyanto , Department of Mathematic, Faculty of Mathematic and Natural Science, Universitas Padjajaran, Bandung, Indonesia

subiyanto@unpad.ac.id

Mohd Kamarulzaki Mustafa, Department of Physics and Chemistry, Faculty of Applied Science and Technology, Universiti Tun Hussein Onn Malaysia, Johor, Malaysia

teguhpuja795@gmail.com

Published

2024-04-11

Issue

Section

Articles